Guo and Stan win the Best Paper Award at SELSE-13

Tuesday, March 28, 2017

University of Virginia PhD Student Xinfei Guo and Professor Mircea Stan won the Best Paper Award at the 13th IEEE Workshop on Silicon Errors in Logic–System Effects (SELSE-13) held in Boston in March. They are also invited to present at a special session at the upcoming IEEE Dependable Systems and Networks (DSN) conference in Denver.